The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Dec. 01, 2015
Linkedin Corporation, Mountain View, CA (US);
Ritesh Maheshwari, Mountain View, CA (US);
Liang Zhang, Fremont, CA (US);
Yang Yang, Fremont, CA (US);
Jieying Chen, Sunnyvale, CA (US);
Toon Sripatanaskul, Menlo Park, CA (US);
Ruixuan Hou, Sunnyvale, CA (US);
Steven S. Noble, Soquel, CA (US);
David Q. He, Cupertino, CA (US);
Sanjay S. Dubey, Fremont, CA (US);
Deepak Agarwal, Sunnyvale, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
The disclosed embodiments provide a system for processing data. During operation, the system obtains a set of components of a time-series performance metric associated with an anomaly in a performance of one or more monitored systems. For each component in the set of components, the system performs a statistical hypothesis test on the component to assess a deviation of the component from a baseline value of the component. When the statistical hypothesis test identifies a statistically significant deviation of the component from the baseline value, the system outputs an alert comprising a root cause of the anomaly that is represented by the statistically significant deviation of the component from the baseline value.