The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Aug. 07, 2018
Applicant:

Nec Laboratories Europe Gmbh, Heidelberg, DE;

Inventors:

Mischa Schmidt, Heidelberg, DE;

Anett Schuelke, Gaiberg, DE;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/28 (2006.01); G05B 15/02 (2006.01); G05B 19/042 (2006.01); G05B 19/05 (2006.01);
U.S. Cl.
CPC ...
H04L 12/2821 (2013.01); G05B 15/02 (2013.01); G05B 19/042 (2013.01); G05B 19/05 (2013.01); H04L 12/2807 (2013.01); G05B 2219/2642 (2013.01); G05B 2219/32328 (2013.01);
Abstract

A method for operating one or more service systems by an analyzing computer including a memory and a processor includes receiving one or more received control requests (RCR) for controlling one or more resources of one or more service systems and anticipating one or more future control requests (ACR) based on one or more of the RCR, one or more prior stored control requests, and/or one or more already served control requests (SCR). The method further includes assessing an impact of selected control requests (CR) on resources of the one or more service systems, wherein the selected CR include one or more of the RCR and/or one or more of the ACR. In addition, the method includes determining, by the AE, that an assessed impact of at least one of the selected CR results in one or more adverse situation rules (ASR) violations.


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