The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Feb. 26, 2016
New York University, New York, NY (US);
Theodore Rappaport, Riner, VA (US);
George R. MacCartney, Aston, PA (US);
New York University, New York, NY (US);
Abstract
Exemplary systems and methods can be provided for measuring a parameter—e.g., channel impulse response and/or power delay profile—of a wideband, millimeter-wave (mmW) channel. The exemplary systems can include a receiver configured to receive a first signal from the channel, generate a second signal, and measure the parameter based on a comparison between the first and second signals; and a controller configured to determine first and second calibration of the system before and after measuring the parameter, and determine a correction for the parameter measurement based on the first and second calibrations. Exemplary methods can also be provided for calibrating a system for measuring the channel parameter. Such methods can be utilized for systems in which the TX and RX devices share a common frequency source and for systems in which the TX and RX devices have individual frequency sources that free-run during channel measurements.