The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Jul. 12, 2017
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Roee Sfaradi, Nes Ziona, IL;
Omry Sendik, Givatayim, IL;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;
Abstract
Exemplary embodiments of the invention as described herein generally provide for detecting the displacement of feature(s) within a visual image in cases where pattern matching fails due to the existence of aperture(s) caused for example by external condition(s) encountered in recording such an image over time. Technique(s) are disclosed for detecting the difference between displacement of a geometric feature of an object appearing within an image (e.g., an edge or smooth surface) that has an aperture and another feature (e.g., a corner) that does not since it is not symmetrically invariant.