The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Mar. 06, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Priyam Aneja, New Delhi, IN;

Laxmi V. Bhatt, Pune, IN;

Sonal Bhatt, Chhindwara, IN;

Meghali V. Munoli, Pune, IN;

Sonia L. Sequeira, Pune, IN;

Hemant K. Sivaswamy, Pune, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01);
Abstract

A method for comparing and analyzing data based on data analysis reports is provided. The method may include receiving a first dataset. The method may also include identifying a first portion of the first dataset and a second portion of the first dataset. Additionally, the method may include comparing and analyzing the first portion of the first dataset with the second portion of the first dataset. The method may also include receiving a second dataset from a location different from the first dataset. The method may further include comparing and analyzing the first portion and second portion of the first dataset with the second dataset. The method may also include receiving a plurality of first analysis results and a plurality of second analysis results based on the comparisons and the analyses. The method may also include presenting the plurality of first analysis results and the plurality of second analysis results.


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