The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Nov. 09, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Dexu Lin, San Diego, CA (US);

Venkata Sreekanta Reddy Annapureddy, San Diego, CA (US);

David Jonathan Julian, San Diego, CA (US);

Casimir Matthew Wierzynski, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/10 (2006.01); G06F 17/11 (2006.01); G06N 3/063 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 17/11 (2013.01); G06N 3/063 (2013.01); G06N 3/10 (2013.01);
Abstract

A method for selecting bit widths for a fixed point machine learning model includes evaluating a sensitivity of model accuracy to bit widths at each computational stage of the model. The method also includes selecting a bit width for parameters, and/or intermediate calculations in the computational stages of the mode. The bit width for the parameters and the bit width for the intermediate calculations may be different. The selected bit width may be determined based on the sensitivity evaluation.


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