The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

May. 24, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Ser Nam Lim, Schenectady, NY (US);

Jingjing Zheng, Niskayuna, NY (US);

Jiajia Luo, Niskayuna, NY (US);

David Scott Diwinsky, West Chester, OH (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/66 (2006.01); G06T 3/40 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/66 (2013.01); G06K 9/627 (2013.01); G06K 9/6215 (2013.01); G06T 3/4007 (2013.01); G06T 3/4053 (2013.01); G06T 7/0002 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A system includes one or more processors and a memory that stores a generative adversarial network (GAN). The one or more processors are configured to receive a low resolution point cloud comprising a set of three-dimensional (3D) data points that represents an object. A generator of the GAN is configured to generate a first set of generated data points based at least in part on one or more characteristics of the data points in the low resolution point cloud, and to interpolate the generated data points into the low resolution point cloud to produce a super-resolved point cloud that represents the object and has a greater resolution than the low resolution point cloud. The one or more processors are further configured to analyze the super-resolved point cloud for detecting one or more of an identity of the object or damage to the object.


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