The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Jun. 23, 2017
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Conal McGarvey, Seattle, WA (US);

Andrew D. Mikesell, Kirkland, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/24 (2006.01); G06F 11/07 (2006.01); G06F 13/26 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 13/24 (2013.01); G06F 11/0745 (2013.01); G06F 11/0772 (2013.01); G06F 13/26 (2013.01); G06F 11/079 (2013.01); G06F 11/0778 (2013.01); G06F 17/30294 (2013.01);
Abstract

Enhanced techniques for detecting programming errors in device drivers are provided. The techniques disclosed herein enable a system to measure a number of aspects of IRPs including, but not limited to, data identifying processed IRPs, data indicating concurrent IRPs, data identifying a stack location associated with a status of an IRP, and individual status values, which may indicate whether IRPs have failed, succeeded or pended. The disclosed techniques enable a system to determine when and where IRPs were sent or not sent to a stack of device objects and/or to individual device objects. The disclosed techniques enable the system to measure the processing of concurrent IRPs. By the use of filters that are positioned in predetermined locations within a stack, disclosed techniques can test and monitor drivers without imposing unduly burdensome loads on the system.


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