The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Dec. 19, 2016
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Alex Levin, Cupertino, CA (US);

Ron Diamant, Albany, CA (US);

Christopher James BeSerra, Federal Way, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3027 (2013.01); G06F 11/221 (2013.01); G06F 11/2221 (2013.01); G06F 11/2289 (2013.01); G06F 11/3037 (2013.01); G06F 11/3051 (2013.01);
Abstract

A smart add-in card can be leveraged to perform testing on a host server computer. The add-in card can include an embedded processor and memory. Tests can be downloaded to the add-in card to test a communication bus between the host server computer (motherboard) and the add-in card. In a particular example, a PCIe communication bus couples the motherboard to the add-in card and the tests can inject errors on the PCIe communication bus. The tests can be developed to test errors that are typically difficult to test without the use of special hardware. However, the smart add-in card can be a simple Network Interface Card (NIC) that resides on the host server computer during normal operation and is used for communication other than error testing. By using the NIC as a testing device, repeatable and reliable testing can be obtained.


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