The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Feb. 10, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Christopher J. Blythe, Austin, TX (US);

Michael H. Dawson, Ontario, CA;

Curtis E. Hrischuk, Holly Springs, NC (US);

Aaron J. Quirk, Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 9/50 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 9/45558 (2013.01); G06F 9/45533 (2013.01); G06F 9/50 (2013.01); G06F 11/3409 (2013.01); G06F 11/3419 (2013.01); G06F 11/3442 (2013.01); G06F 2009/45591 (2013.01); G06F 2201/815 (2013.01);
Abstract

Real-time application metrics of an application executed by a virtual machine are dynamically monitored by a controlling agent and analyzed to determine an optimal configuration of the virtual machine for executing the application. Based on the measured metrics, tunable parameters of the virtual machine may be adjusted to achieve desired application performance.


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