The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Nov. 20, 2016
Applicant:

Renesas Electronics Corporation, Koutou-ku, Tokyo, JP;

Inventors:

Kazuyuki Tokorozuki, Ibaraki, JP;

Toshihiro Nakajima, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 99/00 (2010.01); G05B 19/406 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G05B 19/4184 (2013.01); G05B 2219/33322 (2013.01); G05B 2219/45031 (2013.01); G06N 99/005 (2013.01); Y02P 90/02 (2015.11);
Abstract

A sensor monitors a treatment status of a predetermined manufacturing device, and an abnormality detection device detects an abnormality of a sensor signal that is a monitoring result of the sensor. The sensor signal is a digital data group obtained by sampling an analog waveform at a predetermined sampling period. A management apparatus learns characteristics of a plurality of digital data groups accumulated in past times through use of artificial intelligence to generate a learned model. An abnormality detection device holds the learned model and determines whether an abnormality is present in the digital data group of a current processing target by using the learned model.


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