The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Dec. 04, 2013
Beijing Zhigu Rui Tuo Tech Co., Ltd, Beijing, CN;
Lin Du, Beijing, CN;
Hongjiang Zhang, Beijing, CN;
BEIJING ZHIGU RUI TUO TECH CO., LTD, Beijing, CN;
Abstract
An imaging analysis apparatus includes: an information processing module, used to receive position and depth information of an imaging lens group and/or imaging receiver relative to an object, obtain an imaging parameter corresponding to the imaging lens group according to the position and depth information, and send the obtained imaging parameter. An imaging lens group, used to image an object, can include subregions having adjustable imaging characteristics; and a lens adjustment module, used to receive the imaging parameter of the imaging lens group, determine a subregion corresponding to the imaging parameter, and adjust the imaging characteristic of the subregion. An object can be imaged by using an imaging lens in which each subregion has adjustable imaging parameters, thereby adjusting and correcting a perspective deformation that occurs on the object, and preventing a perspective deformation from occurring on an image of the object acquired by a user.