The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Jun. 21, 2016
Applicants:
Naoki Miyatake, Kanagawa, JP;
Naoki Nakamura, Saitama, JP;
Tadashi Nakamura, Kanagawa, JP;
Inventors:
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/01 (2006.01); B60K 35/00 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0101 (2013.01); B60K 35/00 (2013.01); G02B 26/10 (2013.01); B60K 2350/2047 (2013.01); G02B 2027/014 (2013.01); G02B 2027/0118 (2013.01); G02B 2027/0145 (2013.01); G02B 2027/0154 (2013.01);
Abstract
An optical scanning apparatus includes a light source to emit light, a light deflector having a reflection face to deflect the light as a scan-use light to scan an image generation element by oscillating the reflection face, a light receiving element to receive a control-use light to generate a signal used for controlling a scanning condition of the scan-use light, and a control unit to control the scanning condition of the light deflector based on the generated signal.