The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Oct. 16, 2017
Olympus Corporation, Tokyo, JP;
Masayuki Nakatsuka, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Provided is a microscope system including: a stage on which a sample is placed and that is movable in a direction orthogonal to an observation optical axis; a detecting unit that detects a position of the stage; an imaging unit that acquires an image of the sample on the stage; an image generating unit that generates an overlapped image by overlapping the acquired image with the position of the stage; a searching unit that searches for a position of the acquired image in the generated overlapped image; and a control unit that performs control including causing the image generating unit to stop the overlapping process and causing the searching unit to execute the position search when detection by the detecting unit fails, and causing the image generating unit to resume the overlapping process starting from a search position of the searching unit when the search is successful.