The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Apr. 19, 2013
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Frank Hecht, Mannheim, DE;
Frank Sieckmann, Bochum, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for execution upon operation of a microscope or for depiction of an object, or a part thereof, imaged with the microscope includes depicting a proxy of the object on a display of the microscope or on a further display. At least one manipulation is performed on the proxy, or on the depiction of the proxy, using an input means. At least one depiction parameter for the depiction of the object or of the part of the object, or at least one microscope control parameter, is derived from the manipulation. The object or the part of the object is depicted in consideration of the derived depiction parameter or of the derived microscope control parameter.