The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Oct. 31, 2014
Université D'aix-marseille, Marseilles, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Jérôme Wenger, Vitrolles, FR;
Pierre Dominique Bon, Palaiseau, FR;
Serge Olivier Pierre Monneret, Marseilles, FR;
Centre National de la Recherche Scientifique, Paris, FR;
Université Aix-Marseille, Marseilles, FR;
Abstract
The invention relates to a device (II) for three-dimensional focusing in a microscope (I) with a given resolution, comprising: —a detector () making it possible to determine, in a given measuring plane, a phase and intensity image of an electromagnetic field resulting from the interaction of an incident light wave with a reference object () situated in a reference medium with a given index and having a complex refractive index, the real part and/or the imaginary part of which differs from the real part and/or the imaginary part, respectively, of the refractive index of the reference medium; —computation means () making it possible to determine a three-dimensional position variation of the reference object () from at least one phase and intensity image.