The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Jun. 27, 2016
Applicant:
Nikon Corporation, Tokyo, JP;
Inventor:
Takaaki Okamoto, Fujisawa, JP;
Assignee:
NIKON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); H04N 5/232 (2006.01); H04N 5/235 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0088 (2013.01); G02B 21/245 (2013.01); G02B 21/367 (2013.01); H04N 5/232 (2013.01); H04N 5/2352 (2013.01); H04N 5/23245 (2013.01); H04N 5/23293 (2013.01);
Abstract
Disclosed is a photographing control device, microscope and program that can simply confirm whether time lapse photography is being executed normally or not. A photographing control unit may control an operation of each apparatus of the microscope that performs processing related to the time lapse photography, in an execution mode for executing the time lapse photography, and a test mode for confirming an operation of the time lapse photography before the execution mode. The photographing control unit may also control the operation of each apparatus of the microscope in the execution mode according to information acquired in the test mode.