The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Dec. 08, 2015
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Guosong Hong, Somerville, MA (US);
Alexander Antaris, Stanford, CA (US);
Shuo Diao, Jilin, CN;
Hongjie Dai, Cupertino, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
Disclosed are methods and devices for confocal microscopy in the near-infrared. wavelength. The device uses a near-infrared (NIR) light producing source such as laser; optical components designed to reflect and transmit NIR from a sample; and an NIR detector coupled to a computer for constructing a focal plane image from a raster scan. The detector may be a photodiode or photo-multiplier tube for detecting fluorescence signals in the NIR (800-1700 nm) wavelength range using a variety of NIR-I (800-1000 nm) and NIR-II (1000-1700 nm) dyes and nanomaterials. An imaging method is described using the NIR-confocal microscope for slice by slice 3D imaging of biological tissues throughout a thickness up to, for example, 5 mm in the NIR-II window. The reduced scattering in NIR-II allows for tissue penetration up to about 5-10 mm, superior to ˜0.2 mm afforded by conventional imaging.