The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Mar. 22, 2017
Wisconsin Alumni Research Foundation, Madison, WI (US);
Scott B. Reeder, Middleton, WI (US);
Xiaoke Wang, Madison, WI (US);
Diego Hernando, Madison, WI (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
A system and method are provided for determining B1 inhomogeneities or creating a T1 map of a subject using a magnetic resonance imaging (MRI) system that is corrected for an influence of a presence of fat and a presence of iron in the subject on T1 weighting. The method includes controlling the MRI system using a single pulse sequence to acquire, from the subject, a plurality of datasets with varied T1 weighting created by varying at least one of a repetition time (TR) and a flip angle (FA) for repetitions of the single pulse sequence. The method also includes using an MR signal model and the plurality of datasets, estimating B1 inhomogeneities or generating a T1 map of the subject that is corrected for an influence of a presence of fat and a presence of iron in the subject on T1 weighting in the plurality of datasets.