The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

May. 24, 2017
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Eric John Schindelholz, Albuquerque, NM (US);

Kenneth Miguel Armijo, Albuquerque, NM (US);

Jay Johnson, Albuquerque, NM (US);

Richard Karl Harrison, Albuquerque, NM (US);

Benjamin Bing-Yeh Yang, Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 1/00 (2006.01); H02S 50/10 (2014.01); G01R 31/02 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/025 (2013.01); G01R 31/2846 (2013.01);
Abstract

The present invention relates to systems for generating an arc fault in an electrical circuit, as well as methods thereof. In particular, the system provides a platform that can produce an arc discharge in a controlled manner, while measuring various parameters to characterize that discharge. Such parameters include voltage measurements, current measurements, optical spectroscopy measurements, electron temperatures, and/or plasma temperatures.


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