The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Feb. 17, 2016
Bristol-myers Squibb Company, Princeton, NJ (US);
Steve Angermund, Kinelon, NJ (US);
George Currier, North Brunswick, NJ (US);
Joe Jy Koo, Weehawken, NJ (US);
BRISTOL-MYERS SQUIBB COMPANY, Princeton, NJ (US);
Abstract
An inspection device and method for testing and inspecting integrity of a container () is disclosed. The inspection device has an angled member () and a viewing member () secured to the angled member. Together, the angled and viewing members are configured to hold a container to be analyzed. The inspection device also includes a cradle () secured to the angled member, the cradle including a cavity () configured to hold the angled member at an angle. The inspection device also includes a light source holder () secured to the viewing member, a leg member () extending from the light source holder, and at least one light source () extending through the light source holder. The light source has a first end extending outwardly from the light source holder and a second end extending within the light source holder from which light projects. The light from the light source is projected toward the viewing member. The viewing member includes at least one viewing window (). A lens is located between the second end of the light source and the viewing member, and a filter is located between the lens and the viewing member.