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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10261016 B1

PDFFull Text
Date of Patent:
Apr. 16, 2019

Filed:

Mar. 15, 2016

Specimen analyzing method and specimen analyzing apparatus

Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Norimasa Yamamoto, Kobe, JP;

Takashi Yamato, Kobe, JP;

Naohiko Matsuo, Kobe, JP;

Satoshi Iguchi, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe-shi, Hyogo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Dennis White

Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/59 (2006.01); G01N 35/02 (2006.01); G01N 21/17 (2006.01); G01N 21/03 (2006.01); G01N 21/31 (2006.01); G01N 33/53 (2006.01); G01N 33/86 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/59 (2013.01); G01N 21/0332 (2013.01); G01N 21/17 (2013.01); G01N 21/31 (2013.01); G01N 33/5302 (2013.01); G01N 33/86 (2013.01); G01N 35/00594 (2013.01); G01N 35/025 (2013.01); G01N 35/00603 (2013.01); G01N 2035/00465 (2013.01); G01N 2201/0231 (2013.01); G01N 2201/062 (2013.01); Y10S 436/815 (2013.01); Y10S 436/817 (2013.01); Y10T 436/11 (2015.01); Y10T 436/112499 (2015.01); Y10T 436/113332 (2015.01); Y10T 436/146666 (2015.01);
Abstract

A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container () and sampling it in a first container (), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container () and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.

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