The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Jun. 30, 2016
Applicant:
Vanderbilt University, Nashville, TN (US);
Inventors:
Darryl J. Bornhop, Nashville, TN (US);
Michael Kammer, Nashville, TN (US);
Assignee:
Vanderbilt University, Nashville, TN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01B 9/02 (2006.01); G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01B 9/02001 (2013.01); G01N 21/75 (2013.01); G01N 2021/458 (2013.01); G01N 2201/06113 (2013.01);
Abstract
Provided are improved optical detection systems and methods for using same, which systems and methods comprise single channel interferometric detection systems and methods for determining a characteristic property of samples. Such interferometric detection systems and methods employ a light beam that impinges two or more discrete zones along a channel, thereby avoiding variations that can result in increases in detection limits and/or measurement errors.