The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Jun. 06, 2016
1087 Systems, Inc., Cambridge, MA (US);
Matthias Wagner, Cambridge, MA (US);
1087 Systems, Inc., Cambridge, MA (US);
Abstract
This disclosure concerns methods and apparatus for interferometric spectroscopic measurements of particles with higher signal to noise ratio utilizing an infrared light beam that is split into two beams. At least one beam may be directed through a measurement volume containing a sample including a medium. The two beams may then be recombined and measured by a detector. The phase differential between the two beams may be selected to provide destructive interference when no particle is present in the measurement volume. A sample including medium with a particle is introduced to the measurement volume and the detected change resulting from at least one of resonant mid-infrared absorption, non-resonant mid-infrared absorption, and scattering by the particle may be used to determine a property of the particle. A wide range of properties of particles may be determined, wherein the particles may include living cells.