The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Feb. 17, 2016
Applicant:
Nsk Ltd., Tokyo, JP;
Inventors:
Tomoyuki Yanagisawa, Fujisawa, JP;
Tomoyuki Aizawa, Fujisawa, JP;
Assignee:
NSK LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 1/08 (2006.01); G01M 13/02 (2019.01); G01M 13/04 (2019.01); G01N 29/00 (2006.01); F16C 19/52 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 13/04 (2013.01); G01M 99/00 (2013.01); F16C 19/52 (2013.01);
Abstract
An abnormality diagnosis system includes a bearing having a plurality of components, a plurality of sensors disposed at different positions of the component and configured to detect surrounding signals, and an abnormality diagnosis device configured to diagnose abnormalities of the rolling bearing and a device disposed around the rolling bearing, based on signals output from the plurality of sensors.
Quick Actions:
Yanagisawa, Tomoyuki. (2019). Abnormality diagnosis system (U.S. Patent No. 10260991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10260991
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile