The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Apr. 14, 2014
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Xin Chen, Corning, NY (US);

Jason Edward Hurley, Corning, NY (US);

Ming-Jun Li, Horseheads, NY (US);

Richard Stephen Vodhanel, Red Bank, NJ (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/338 (2013.01); G01M 11/335 (2013.01);
Abstract

A differential mode delay (DMD) measurement system for an optical fiber is provided. The system includes an optical test fiber with a plurality of modes; a single mode light source that provides a continuous light wave signal to a modulator; and a pulse generator that provides an electrical pulse train signal to the modulator and a triggering signal to a receiver. The modulator is configured to generate a modulated optical test signal through the optical fiber based at least in part on the received light wave and pulse train signals, and the receiver is configured to receive the test signal transmitted through the fiber and evaluate the test signal based at least in part on the triggering signal. The system can be employed to create DMD waveform and centroid charts to obtain minEMBc bandwidth information for a fiber within a wavelength range.


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