The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Jun. 13, 2018
National Applied Research Laboratories, Taipei, TW;
Wei-Yao Hsu, Hsinchu, TW;
Wei-Jei Peng, Hsinchu, TW;
Zong-Ru Yu, Hsinchu, TW;
Jung-Hsin Wang, Hsinchu, TW;
Po-Jui Chen, Hsinchu, TW;
Cheng-Fang Ho, Hsinchu, TW;
Chi-Hung Huang, Hsinchu, TW;
Chun-Cheng Chen, Hsinchu, TW;
Hua-Lin Chen, Hsinchu, TW;
Yi-Hao Lin, Hsinchu, TW;
Ming-Fu Chen, Hsinchu, TW;
NATIONAL APPLIED RESEARCH LABORATORIES, Taipei, TW;
Abstract
The present disclosure illustrates a non-contact measurement device for a radius of curvature and a thickness of a lens and a measurement method thereof. The non-contact measurement device utilizes a non-contact probe to integrate a motor, an optical scale and an electronic control module, so as to achieve measurement for the radius of curvature and the thickness of the lens. The present disclosure adopts astigmatism to achieve fast and precise focusing. To overcome the spherical aberration problem, thickness measurement can be implemented by the non-contact measurement device through a formula calculation and utilization of a correction plate, wherein single one probe is used for the measurement herein. For the thicker lens, the non-contact measurement device can be extended to use dual probes, so as to detect the top and bottom sides of the lens.