The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Aug. 11, 2016
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Roger W. Engelbart, St. Louis, MO (US);

Nathan R. Smith, St. Charles, MO (US);

Loyal B. Shawgo, O'Fallon, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 5/08 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0066 (2013.01); G01J 5/0887 (2013.01); G01J 5/0896 (2013.01); G01N 21/8806 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A method of thermographic inspection includes absorbing, at an applique applied to a test area of an article, light from a testing light source. The method further includes emitting, by the applique, thermal radiation directed to a capture device, the thermal radiation corresponding to at least a portion of the light absorbed by the applique.


Find Patent Forward Citations

Engelbart, Roger. (2019). Applique and method for thermographic inspection (U.S. Patent No. 10260953). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10260953

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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