The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Nov. 30, 2017
Nuctech Company Limited, Beijing, CN;
Huacheng Feng, Beijing, CN;
Yumin Yi, Beijing, CN;
Hongqiu Wang, Beijing, CN;
Rui Fan, Beijing, CN;
Shixin Zhang, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A Raman spectrum-based object inspection apparatus and a Raman spectrum-based object inspection method are disclosed. In one aspect, an example apparatus includes: a laser device configured to emit a laser; an optical guiding device configured to guide the laser to an object to be detected and collect a Raman scattering light from the object. The apparatus includes a spectrum generator configured to receive the Raman scattering light collected by the optical guiding device and generate a Raman spectroscopic signal. The spectrum analyzer is configured to analyze the Raman spectroscopic signal to obtain an inspection result. The apparatus includes a monitoring device configured to monitor a state of the object and control an object inspection operation depending on the state of the object.