The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
Apr. 08, 2016
X-rite Switzerland Gmbh, Regensdorf, CH;
Peter Ehbets, Zurich, CH;
Matthias Scheller Lichtenauer, Bubikon, CH;
X-Rite Switzerland GmbH, Regensdorf, CH;
Abstract
A color measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays () for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction () in each case, and a pick-up array () for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction () and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.