The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Oct. 04, 2016
Applicant:

Precitec Optronik Gmbh, Neu-Isenburg, DE;

Inventors:

David Marsaut, Gréasque, FR;

Martin Schönleber, Aschaffenburg, DE;

Assignee:

PRECITEC OPTRONIK GMBH, Neu-Isenburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01B 11/00 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0256 (2013.01); G01B 11/005 (2013.01); G01B 11/026 (2013.01); G01J 3/0202 (2013.01); G01J 3/0286 (2013.01); G01J 3/0291 (2013.01); G01B 2210/50 (2013.01);
Abstract

A chromatic confocal distance sensor has a housing in which a polychromatic light source, imaging optics having a longitudinal chromatic aberration, a spectrometer and a planar beam splitter surface are arranged. These lie in the light path of the measurement light between the light source and the imaging optics and between the imaging optics and the spectrometer. A first diaphragm is arranged in the light path between the light source and the beam splitter surface, and a second diaphragm is arranged in the light path between the beam splitter surface and the spectrometer. The diaphragms are arranged mirror-symmetrically with respect to the beam splitter surface. The measurement light propagates as a free beam inside the housing. The beam splitter surface, the first diaphragm and the second diaphragm are fastened together on a carrier which has an isotropic thermal expansion coefficient. This way, temperature changes cannot significantly affect the measurement accuracy.


Find Patent Forward Citations

Loading…