The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Oct. 02, 2014
Applicant:

Renishaw Plc, Wotton-under-Edge, Gloucestershire, GB;

Inventor:
Assignee:

RENISHAW PLC, Wotton-Under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01B 11/00 (2006.01); G01B 21/04 (2006.01); G01N 21/88 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 11/24 (2013.01); G01B 21/047 (2013.01); G01N 21/8806 (2013.01); H04N 7/183 (2013.01); G05B 2219/37063 (2013.01); G05B 2219/37199 (2013.01); G05B 2219/37572 (2013.01);
Abstract

A method of inspecting an object with a camera probe for capturing an image of an object, the camera probe being movable along a path by a measurement apparatus, at least a part of the camera probe being rotatable about at least one axis. The method includes: a) the measurement apparatus moving the camera probe relative to the object along an inspection path and b) for at least one period as the camera probe moves along the inspection path: turning at least a part of the camera probe about the at least one axis thereby slowing the passage of a feature of interest on the object across the camera probe's field of view; and capturing at least one image of the feature of interest during at least a portion of the turning.


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