The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2019
Filed:
May. 30, 2017
Vishal Khosla, San Jose, CA (US);
Nick Doe, San Jose, CA (US);
Ming Chan, San Jose, CA (US);
Jun Xiao, San Jose, CA (US);
Gautam Char, San Jose, CA (US);
Vishal Khosla, San Jose, CA (US);
Nick Doe, San Jose, CA (US);
Ming Chan, San Jose, CA (US);
Jun Xiao, San Jose, CA (US);
Gautam Char, San Jose, CA (US);
Other;
Abstract
Proposed is a method for in-line testing and surface analysis of test material with participation of Raman spectroscopy wherein the apparatus has a column with a plurality of test units at least one of which is a wear test unit and another is a Raman spectrometer. The sample is located on a rotary table under the test units. By sequentially removing the material of the sample to a predetermined depth and then conducting the surface analysis with the use of the Raman spectrometer, it becomes possible to analyze distribution of the material components in the depth direction from the surface of the sample. delivery beams to the longitudinal axis of the Raman spectrometer