The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

May. 23, 2017
Applicant:

Custom Manufacturing & Engineering, Inc., Pinellas Park, FL (US);

Inventor:

Stephan Peter Athan, Tampa, FL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01); G01N 21/954 (2006.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/232 (2013.01); H04N 5/2258 (2013.01); H04N 5/23296 (2013.01); G01N 21/954 (2013.01);
Abstract

Embodiments of the invention relate to a method and apparatus for imaging. Specific embodiments can incorporate an imaging module having at least one first imager, where each first imager images a corresponding at least one first portion of a θ° field of view about a reference point, such that the at least one first imager images the θ° field of view. In a specific embodiment θ is at least 90°. The imaging module can also incorporate at least one second imager, where each second imager images a corresponding at least one second portion of the θ° field of view about the reference point, and one or more of the at least one first imager has a different magnification than one or more of the at least one second imager. Embodiments can allow imaging of a θ° field of view about a reference point with imagers having at least two different magnifications.


Find Patent Forward Citations

Loading…