The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Mar. 22, 2016
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Todd Bauer, Albuquerque, NM (US);

Jason Hamlet, Albuquerque, NM (US);

Ryan Michael Birmingham, Albuquerque, NM (US);

Lyndon G. Pierson, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/00 (2006.01); H04L 9/32 (2006.01); H04L 9/08 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); H04L 9/0861 (2013.01);
Abstract

Described herein are various technologies pertaining to authentication of integrated circuits by using external factors to affect or modify an output of a physically unclonable function (PUF) circuit. In an example, the output of the PUF circuit in response to a challenge signal can be sensitive to changes in environmental factors. In another example, the output of the PUF circuit can be sensitive to user-selectable configuration parameters of the PUF circuit. In yet another example, the output of the PUF circuit can be modified by additional circuitry external to the PUF circuit based upon one or more selectable or configurable inputs. A PUF-based device authentication system that uses external factors as authentication inputs to affect a challenge response of the device authentication system can enhance authentication capabilities by permitting multi-factor authentication.


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