The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Aug. 31, 2017
Applicant:

Maxlinear, Inc., Carlsbad, CA (US);

Inventors:

Raja Pullela, Irvine, CA (US);

Glenn Chang, Carlsbad, CA (US);

Sridhar Ramesh, Carlsbad, CA (US);

Assignee:

MAXLINEAR, INC., Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/185 (2006.01); H04L 7/033 (2006.01); H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
H04B 7/18513 (2013.01); H04L 7/0054 (2013.01); H04L 7/0331 (2013.01);
Abstract

Methods and systems are provided for guard band detection and frequency offset detection. For each of a plurality of downconverted signals, frequency related information associated with one or more corresponding circuits used in obtaining the plurality of downconverted signals may be determined; and based on the determined frequency related information, one or both of a band stacking operation and a channel stacking operation may be performed. During the band stacking operation, frequency bands are not stacked on each other or stacked frequency bands do not overlap. During the channel stacking operation, channels are not stacked on each other or stacked channels do not overlap. The frequency related information may be determined based on predefined frequency related parameters associated with the corresponding circuits. Frequency corrections may be performed, on output signals corresponding to the band stacking operation and/or the channel stacking operation, based on the frequency related information.


Find Patent Forward Citations

Loading…