The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Jun. 10, 2014
Massachusetts Institute of Technology, Cambridge, MA (US);
Hamamatsu Photonics K.k., Hamamatsu, JP;
Gabriel Popescu, Champaign, IL (US);
Ramachandra Dasari, Shererville, IN (US);
Michael Feld, Jamaica Plain, MA (US);
Takahiro Ikeda, Hamamatsu, JP;
Massachusetts Institute of Technology, Cambridge, MA (US);
Hamamatsu Photonics K.K., Hamamatsu, JP;
Abstract
Hilbert phase microscopy (HPM) as an optical technique for measuring high transverse resolution quantitative phase images associated with optically transparent objects. Due to its single-shot nature, HPM is suitable for investigating rapid phenomena that take place in transparent structures such as biological cells. A preferred embodiment is used for measuring biological systems including measurements on red blood cells, while its ability to quantify dynamic processes on the millisecond scale, for example, can be illustrated with measurements on evaporating micron-size water droplets.