The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Jul. 02, 2015
Applicant:

Nanotech Analysis S.r.l.s., Turin, IT;

Inventors:

Gianpiero Mensa, Turin, IT;

Raffaele Correale, Turin, IT;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/00 (2006.01); G01N 33/00 (2006.01); H01J 49/14 (2006.01); H01J 49/24 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0422 (2013.01); G01N 33/0016 (2013.01); H01J 49/0022 (2013.01); H01J 49/0427 (2013.01); H01J 49/147 (2013.01); H01J 49/24 (2013.01);
Abstract

An electronic devicefor analyzing a gas composition, which is present in an environment A at an environment pressure Pa, is described. The deviceis portable and comprises a gas sampling module, an ion filtering moduleand an ion detecting module. The sampling moduleis configured to adjust an input gaseous flow Fi of gaseous particles from the environment A and to ionize said gaseous particles and to generate an ion flow I having an ion composition representative of the gas composition to be analyzed. The ion filtering moduleis configured to controllably select at least one type of ions present in the ion flow I and to generate a corresponding at least one homogeneous ion beam I'. The ion detecting moduleis configured to measure the intensity of such least one ion beam I′.


Find Patent Forward Citations

Loading…