The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Oct. 26, 2016
X-ray Optical Systems, Inc., East Greenbush, NY (US);
Zewu Chen, Schenectady, NY (US);
Rory D. Delaney, Slingerlands, NY (US);
John H. Burdett, Charlton, NY (US);
Kai Xin, Wynantskill, NY (US);
X-RAY OPTICAL SYSTEMS, INC., East Greenbush, NY (US);
Abstract
A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.