The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Aug. 09, 2016
Bentley Systems, Incorporated, Exton, PA (US);
Elenie Godzaridis, Quebec, CA;
Mathieu St-Pierre, Ste-Brigitte de Laval, CA;
Bentley Systems, Incorporated, Exton, PA (US);
Abstract
In an example embodiment, a technique is provided for reconstructing a coherent tiled mesh surface that preserves the 2.5D Delaunay property. A spatial index is built for 2.5D data, the spatial index including nodes that correspond to a plurality of tiles of the 2.5D data. A 2.5D Delaunay triangulation algorithm is applied to data of nodes of the spatial index to create a plurality of independent mesh surfaces that each correspond to a tile. The plurality of independent mesh surfaces are stitched together to form the coherent tiled mesh surface. After a coherent mesh surface for a level of detail (LOD) is created, it is determined whether a new level of detail (LOD) is required. If so, one or more independent mesh surfaces that have the new LOD are created and stitching is repeated. Finally, a coherent multi-resolution tiled mesh surface is output.