The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Jul. 19, 2016
Vmware, Inc., Palo Alto, CA (US);
Xingze He, San Jose, CA (US);
Banit Agrawal, Cupertino, CA (US);
Rishi Bidarkar, Sunnyvale, CA (US);
Hari Sivaraman, Livermore, CA (US);
Uday Kurkure, Los Altos Hills, CA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
Techniques are described for improving the measurement of visual perception of graphical user interface (GUI) information remoted to client devices in virtual desktop environments, such as VDI and DAAS. An objective image quality measurement of remoted virtual desktop interfaces is computed, that is more accurate and more closely aligned with subjective user perception. The visual quality metric is computed using a linear fusion model that combines a peak signal to noise ratio (PSNR) score of the distorted image, a structural similarity (SSIM) score of the distorted image and a feature similarity (FSIM) score of the distorted image. Prior to using the model to compute the quantitative visual perception metric, the linear fusion model is trained by using a benchmark test database of reference images (e.g., virtual desktop interface images), distorted versions of those images and subjective human visual perception quality ratings associated with each distorted version.