The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Jul. 28, 2015
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Nandu Gopalakrishnan, Chatham, NJ (US);
Yirui Hu, Piscataway, NJ (US);
Assignee:
Futurewei Technologies, Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 99/00 (2010.01); G06N 7/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 5/02 (2013.01); G06N 99/005 (2013.01);
Abstract
An anomaly detection apparatus, method, and computer program product are provided using a probabilistic latent semantic analysis (PLSA). In use, data is received, and a PLSA is performed, based on the data. Further, one or more anomalies are detected in the data, based on the PLSA. Still yet, information identifying the one or more anomalies is stored and/or displayed.
Gopalakrishnan, Nandu. (2019). Anomaly detection apparatus, method, and computer program using a probabilistic latent semantic analysis (U.S. Patent No. 10255554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10255554
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile