The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Jun. 30, 2017
Wipro Limited, Bangalore, IN;
Adrita Barari, Kolkata, IN;
Manjunath Ramachandra, Bangalore, IN;
Ghulam Mohiuddin Khan, Bangalore, IN;
Wipro Limited, Bangalore, IN;
Abstract
A testing device for performing testing across a plurality of smart devices is disclosed. The testing device may be configured to register the plurality of smart devices to be accessed for performing testing. At least one time-window at which each smart device is idle may be determined, by the testing device, for the plurality of smart devices. Upon gathering the testing criteria and time duration for performing a testing operation, the testing device may be configured to dynamically create a test group that includes one or more smart devices from the plurality of smart devices such that the one or more smart devices in the test group satisfy the testing criteria and the at least one time-window of smart devices in the test group is within the time duration.