The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Jan. 31, 2016
Applicants:

Tsinghua University, Beijing, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Jun Zhu, Beijing, CN;

Tong Yang, Beijing, CN;

Xiao-Fei Wu, Beijing, CN;

Guo-Fan Jin, Beijing, CN;

Shou-Shan Fan, Beijing, CN;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G02B 17/06 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G02B 17/0642 (2013.01); G02B 17/0663 (2013.01); G02B 27/0012 (2013.01);
Abstract

A method for designing off-axial optical system with freeform surfaces is provided. An initial system is established. A freeform surface of the off-axial optical system that needs to be solved is defined as a freeform surface. A number of feature rays are selected. A number of intersections of the feature rays with the freeform surface are calculated point by point based on a given object-image relationship and a vector form of Snell's law. A number of first feature data points are obtained from the intersections and surface fitted to obtain the freeform surface. All the freeform surfaces of the off-axial optical system that need to be solved are obtained by the method above to form a before-iteration off-axial optical system. The before-iteration off-axial optical system is used as the initial system for multiple iterations to obtain an after-iteration off-axial optical system.


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