The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Dec. 14, 2016
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Jong-min Kim, Incheon, KR;
Chan-ho Yoon, Seoul, KR;
Jung-pil Lee, Hwaseong-si, KR;
Hyung-joon Park, Hwaseong-si, KR;
Jae-ho Sim, Suwon-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06F 11/36 (2006.01); G06F 11/273 (2006.01); G06F 11/07 (2006.01); H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2215 (2013.01); G06F 11/079 (2013.01); G06F 11/273 (2013.01); G06F 11/2733 (2013.01); G06F 11/3656 (2013.01); H01L 23/544 (2013.01); H01L 2223/54433 (2013.01); H01L 2223/54446 (2013.01);
Abstract
Provided are a multichip debugging method and a multichip system adopting the same. The multichip system includes: a first chip including a first debugging port and first identification (ID) information, a second chip including a second debugging port and second ID information, and a test access port (TAP) electrically connected to the first debugging port and the second debugging port and configured to connect to a test apparatus via the TAP.