The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Oct. 13, 2016
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xin Jiang, Hong Kong, HK;

Hang Li, Hong Kong, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G05B 23/02 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G05B 23/02 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); H04L 41/00 (2013.01);
Abstract

A fault diagnosis method for a big-data network system includes extracting fault information from historical data in the network system, to form training sample data, which is trained to obtain a deep sum product network model that can be used to perform fault diagnosis; and diagnosing a fault of the network system based on the deep sum product network model. The embodiments of the present application resolve a problem that it is difficult to diagnose a fault of a big-data network system.


Find Patent Forward Citations

Jiang, Xin. (2019). Fault diagnosis method and apparatus for big-data network system (U.S. Patent No. 10255129). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10255129

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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