The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Mar. 06, 2014
Nec Corporation, Minato-ku, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection apparatus () handles tasks allocated to a plurality of processing servers () as processing targets in a distribution system () having the processing servers (). A history acquisition unit () acquires progress history information which is information regarding progress of the plurality of tasks at a plurality of time point of recording. A target range determination unit () determines a target range. A distribution calculation unit () calculates a task speed distribution which is a probability distribution of processing speeds of the tasks using the progress history information regarding the plurality of tasks. An abnormality determination unit () compares a processing speed of a task to be determined with the task speed distribution to thereby determine whether or not the processing speed of the task to be determined is abnormal.