The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Dec. 28, 2015
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventors:

Bunryu Arashi, Hachioji, JP;

Hiroshi Ishiwata, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01); G02B 21/0032 (2013.01); G02B 21/06 (2013.01);
Abstract

A phase contrast microscope includes a light source, an illumination optical system configured to irradiate an observation object with the light from the light source, and a magnifying optical system configured to magnify and project the observation object, the illumination optical system includes a ring slit, the magnifying optical system includes an objective provided with a phase film, the ring slit is disposed at a pupil position of the illumination optical system, the phase film is disposed at a position conjugate to the pupil position of the illumination optical system, and the following conditional expression (1) is satisfied:≤0.25  (1)


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