The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Feb. 29, 2016
Lightel Technologies, Inc., Renton, WA (US);
Shangyuan Huang, Seattle, WA (US);
Ge Zhou, Renton, WA (US);
Jyejong Wang, Sammamish, WA (US);
Ray Chen, Seattle, WA (US);
Peifeng Zeng, Shanghai, CN;
LIGHTEL TECHNOLOGIES, INC., Renton, WA (US);
Abstract
A fiber optic connector endface inspection probe includes a microscope system, a camera module, and an image processing system. While the objective lens of the microscope system is being moved towards and past the focused position for the endface of a mated connector, either by manually turning a focusing knob in one direction or via an automatic transmission mechanism, the camera module continuously takes and sends endface images to the image processing system, wherein a microprocessor continuously monitors the sharpness of the endface images to acquire a focused image and analyze it to make an endface inspection pass/fail judgment, without using an external display to monitor the endface images. The microprocessor further comprises an embedded web server for converting endface images and inspection report into web pages to be transmitted by a wireless transmitter of the image processing system to external devices for optional monitoring or manual inspection.