The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Dec. 14, 2012
Essilor International (Compagnie Generale D'optique), Charenton le Pont, FR;
Florence Legrand, Charenton le Pont, FR;
Robert Pellegris, Charenton le Pont, FR;
Vincent Roblot, Charenton le Pont, FR;
Laurent Marcepoil, Charenton le Pont, FR;
Sebastien Maurice, Charenton le Pont, FR;
Frederic Dubois, Charenton le Pont, FR;
ESSILOR INTERNATIONAL, Charenton-le-Pont, FR;
Abstract
A system and method of generating machine marking instructions for marking an ophthalmic lens is disclosed. The method comprises the steps of receiving lens order data related to a lens order, receiving an initial marking layout and calculating, using the lens order data, ophthalmic lens data of an ophthalmic lens related to the lens order. The method also comprises the steps of determining, using the ophthalmic lens data, marking parameters relating to the ophthalmic lens, producing an additional marking layout by modifying the initial marking layout using the marking parameters and the lens order data, the additional marking layout representing the markings to be applied to the ophthalmic lens, and generating machine marking instructions arranged to cause a marking machine to mark the ophthalmic lens in accordance with the additional marking layout.